Probing nanoscale structure and strain by dark-field x-ray microscopy
Can Yildirim, Phil Cook, C. Detlefs, Hugh Simons, Henning Friis Poulsen
Topics & Concepts
Nanoscopic scaleDark field microscopyMicroscopyMaterials scienceNanotechnologyField (mathematics)X-rayOpticsPhysicsMathematicsPure mathematicsAdvanced X-ray Imaging TechniquesForce Microscopy Techniques and ApplicationsAdvanced Electron Microscopy Techniques and Applications