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A nonlinear resistive switching behaviors of Ni/HfO2/TiN memory structures for self-rectifying resistive switching memory

Min Ju Yun, Doowon Lee, Sungho Kim, Christian Wenger, Hee‐Dong Kim

2021Materials Characterization34 citationsDOI

Topics & Concepts

Materials scienceSchottky diodeResistive random-access memoryOptoelectronicsResistive touchscreenTinElectrodeMemristorVoltageSchottky barrierDiodeElectrical engineeringMetallurgyChemistryPhysical chemistryEngineeringAdvanced Memory and Neural ComputingFerroelectric and Negative Capacitance DevicesElectronic and Structural Properties of Oxides
A nonlinear resistive switching behaviors of Ni/HfO2/TiN memory structures for self-rectifying resistive switching memory | Litcius