The approach of nanoscale vision-based measurement via diamond-machined surface topography
Honglu Li, Xinming Fang, Zijian Zhu, Wenpeng Fu, Chenyang Zhao
Topics & Concepts
Accuracy and precisionPixelOpticsResolution (logic)Computer visionMaterials scienceImage resolutionComputer scienceMatching (statistics)System of measurementArtificial intelligencePhysicsMathematicsAstronomyQuantum mechanicsStatisticsAdvanced Surface Polishing TechniquesAdvanced Measurement and Metrology TechniquesOptical measurement and interference techniques