Dielectric surface roughness scattering induced crosstalk performance of coupled MCB interconnects
Manvi Sharma, Mayank Kumar, Rajesh Khanna
Topics & Concepts
Materials scienceDielectricSurface roughnessScatteringOptoelectronicsSilicon carbideTime domainElectronic engineeringOpticsComposite materialPhysicsComputer visionComputer scienceEngineeringCopper Interconnects and Reliability3D IC and TSV technologiesElectromagnetic Compatibility and Noise Suppression