A study on the complex dielectric (ε)/electric-modulus (M)/impedance (Z*), tangent-loss (tanδ), and ac conductivity (σ) of the Al/(S:DLC)/p-Si/Au (MIS)-type Schottky structures in a wide range of frequency and voltage at room temperature (RT)

Akif Tezcan, Sabreen A. Hameed, A. Feizollahi Vahid, Murat Ulusoy, Ş. Altındal

2024Physica B Condensed Matter21 citationsDOI Open Access PDF

Topics & Concepts

Dissipation factorMaterials scienceDielectricElectrical impedanceConductivityModulusComposite materialElectrical resistivity and conductivityElectrical engineeringOptoelectronicsChemistryEngineeringPhysical chemistrySemiconductor materials and interfacesSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis

A study on the complex dielectric (ε*)/electric-modulus (M*)/impedance (Z*), tangent-loss (tanδ), and ac conductivity (σ) of the Al/(S:DLC)/p-Si/Au (MIS)-type Schottky structures in a wide range of frequency and voltage at room temperature (RT)

Topics & Concepts

A study on the complex dielectric (ε)/electric-modulus (M)/impedance (Z*), tangent-loss (tanδ), and ac conductivity (σ) of the Al/(S:DLC)/p-Si/Au (MIS)-type Schottky structures in a wide range of frequency and voltage at room temperature (RT)