A generalized system reliability model based on survival signature and multiple competing failure processes
Miaoxin Chang, Frank P. A. Coolen, Tahani Coolen‐Maturi, Xianzhen Huang
Topics & Concepts
Reliability (semiconductor)MathematicsSignature (topology)Degradation (telecommunications)Inverse Gaussian distributionReliability theoryGamma processShock (circulatory)Process (computing)Reliability engineeringApplied mathematicsAlgorithmComputer scienceFailure rateStatisticsEngineeringDistribution (mathematics)Mathematical analysisPower (physics)MedicineOperating systemTelecommunicationsInternal medicineQuantum mechanicsPhysicsGeometryReliability and Maintenance OptimizationProbabilistic and Robust Engineering DesignStatistical Distribution Estimation and Applications