A multi-code 3D measurement technique based on deep learning
Pengcheng Yao, Shaoyan Gai, Yuchong Chen, Wenlong Chen, Feipeng Da
Topics & Concepts
Robustness (evolution)Computer scienceProfilometerConvolutional neural networkStructured-light 3D scannerArtificial intelligenceCode (set theory)Deep learningAbsolute phaseAlgorithmArtificial neural networkPhase (matter)Computer visionMaterials scienceSurface roughnessScannerChemistryComposite materialOrganic chemistryProgramming languageGeneSet (abstract data type)BiochemistryOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesOptical Systems and Laser Technology