Characterization of the Widmanstätten structure in γ-TiAl alloy using an EBSD-FIB-TEM combined process
Zitong Gao, Rui Hu, Xiangyu Gao, Yulun Wu, Hang Zou, Jinguang Li, Mi Zhou
Topics & Concepts
Materials scienceElectron backscatter diffractionCharacterization (materials science)Lamellar structureMicrostructureNucleationCrystallographyAlloyAtomic unitsMetallurgyNanotechnologyChemistryQuantum mechanicsOrganic chemistryPhysicsIntermetallics and Advanced Alloy PropertiesSemiconductor materials and interfacesRare-earth and actinide compounds