Litcius/Paper detail

Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy

Annelies De wael, Annick De Backer, Lewys Jones, Aakash Varambhia, Peter D. Nellist, Sandra Van Aert

2020Physical Review Letters28 citationsDOIOpen Access PDF

Abstract

We propose a new method to measure atomic scale dynamics of nanoparticles from experimental high-resolution annular dark field scanning transmission electron microscopy images. By using the so-called hidden Markov model, which explicitly models the possibility of structural changes, the number of atoms in each atomic column can be quantified over time. This newly proposed method outperforms the current atom-counting procedure and enables the determination of the probabilities and cross sections for surface diffusion. This method is therefore of great importance for revealing and quantifying the atomic structure when it evolves over time via adatom dynamics, surface diffusion, beam effects, or during in situ experiments.

Topics & Concepts

Atomic unitsScanning transmission electron microscopyDiffusionMaterials scienceAtom (system on chip)Transmission electron microscopyHigh-resolution transmission electron microscopyDark field microscopySurface diffusionMolecular physicsNanoparticleAtomic diffusionComputational physicsAtomic physicsNanotechnologyOpticsMicroscopyPhysicsComputer scienceChemistryPhysical chemistryQuantum mechanicsAdsorptionEmbedded systemThermodynamicsSurface and Thin Film PhenomenaAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy Techniques