A Novel Attribute-Based Symmetric Multiple Instance Learning for Histopathological Image Analysis
Trung Vu, Phung Lai, Raviv Raich, Anh T. Pham, Xiaoli Z. Fern, UK Arvind Rao
Abstract
Histopathological image analysis is a challenging task due to a diverse histology feature set as well as due to the presence of large non-informative regions in whole slide images. In this paper, we propose a multiple-instance learning (MIL) method for image-level classification as well as for annotating relevant regions in the image. In MIL, a common assumption is that negative bags contain only negative instances while positive bags contain one or more positive instances. This asymmetric assumption may be inappropriate for some application scenarios where negative bags also contain representative negative instances. We introduce a novel symmetric MIL framework associating each instance in a bag with an attribute which can be either negative, positive, or irrelevant. We extend the notion of relevance by introducing control over the number of relevant instances. We develop a probabilistic graphical model that incorporates the aforementioned paradigm and a corresponding computationally efficient inference for learning the model parameters and obtaining an instance level attribute-learning classifier. The effectiveness of the proposed method is evaluated on available histopathology datasets with promising results.