A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions
Zhaohui Zheng, Hong Zheng, Jianping Ju, Deng Chen, Xi Li, Zhongyuan Guo, Changhui You, Mingyu Lin
Topics & Concepts
Computer scienceKey (lock)Artificial intelligenceRobustness (evolution)Sample (material)SegmentationPattern recognition (psychology)Construct (python library)Image (mathematics)Computer visionData miningComputer securityChemistryGeneBiochemistryProgramming languageChromatographyIndustrial Vision Systems and Defect DetectionDigital Media Forensic DetectionImage Processing Techniques and Applications