Litcius/Paper detail

Oxygen vacancy-induced nonradical degradation of nitroso-containing organics in Fe3O4@N C electro-Fenton reaction at a wide pH range

Qian Zhang, Xiaoqin Sun, Yuan Dang, Jun‐Jie Zhu, Yuanzhen Zhou

2024Journal of Electroanalytical Chemistry13 citationsDOI

Topics & Concepts

ChemistryNitrosoDegradation (telecommunications)OxygenFenton reactionRange (aeronautics)PhotochemistryNitroso CompoundsRadicalInorganic chemistryOrganic chemistryComposite materialComputer scienceMaterials scienceTelecommunicationsAdvanced oxidation water treatmentElectrochemical Analysis and ApplicationsWater Quality Monitoring and Analysis