The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision
Elliot Padgett, Megan E. Holtz, Paul Cueva, Yu‐Tsun Shao, Eric Langenberg, Darrell G. Schlom, David A. Muller
Topics & Concepts
DiffractionOpticsMaterials scienceLattice (music)CepstrumComputational physicsPhysicsComputer scienceAcousticsArtificial intelligenceSemiconductor materials and devicesForce Microscopy Techniques and ApplicationsUltrasonics and Acoustic Wave Propagation