Quantifying and mitigating alarm fatigue caused by fault detection systems
A Diallo, Lazhar Homri, Thomas Boeuf, Jean‐Yves Dantan, Frédéric Bonnet
Topics & Concepts
Fault detection and isolationConstant false alarm rateALARMReliability engineeringProcess (computing)False alarmKey (lock)Constraint (computer-aided design)Computer scienceEngineeringFault (geology)Operator (biology)Failure rateWarrantyData miningUsabilityReal-time computingProcess industryRisk analysis (engineering)ScarcityControl (management)Manufacturing processArtificial intelligenceCriticalityFalse discovery rateIntrusion detection systemReliability (semiconductor)Process controlFault Detection and Control SystemsAdvanced Statistical Process MonitoringMachine Fault Diagnosis Techniques