Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
Chandra Shakher Pathak, Samir Kumar
Abstract
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
Topics & Concepts
Raman spectroscopyNanotechnologyCharacterization (materials science)Atomic force microscopyNanomaterialsMaterials scienceCarbon nanotubeSpectroscopyMicroscopyOpticsPhysicsQuantum mechanicsForce Microscopy Techniques and ApplicationsConducting polymers and applications