Atomic-scale characterization of structural heterogeny in 2D TMD layers
Hao Li, Changhyeon Yoo, Tae‐Jun Ko, Jung Han Kim, Yeonwoong Jung
Abstract
Recent progress in atomic-scale TEM characterization of structural heterogeny in 2D TMD layers is overviewed. The prospects of visualization techniques are assessed toward atomic-scale identification and manipulation of defects and heterointerfaces.
Topics & Concepts
Characterization (materials science)Atomic unitsScale (ratio)NanotechnologyMaterials scienceIdentification (biology)VisualizationEngineering physicsComputer scienceEngineeringPhysicsGeographyData miningCartographyBiologyQuantum mechanicsBotanyGa2O3 and related materialsGraphene research and applicationsElectronic and Structural Properties of Oxides