Charged particles and gamma-ray shielding features of oxyfluoride semiconducting glasses: TeO2-Ta2O5-ZnO/ZnF2
Y. S. Rammah, Esra Kavaz, U. Perişanoğlu, Gökhan Kılıç, F.I. El‐Agawany, H.O. Tekın
Topics & Concepts
Half-value layerMaterials scienceStopping powerElectromagnetic shieldingAttenuationRange (aeronautics)ProtonRadiation shieldingPhotonEffective atomic numberNeutronAnalytical Chemistry (journal)OpticsNuclear physicsComposite materialDetectorPhysicsChromatographyChemistryRadiation Shielding Materials AnalysisNuclear materials and radiation effectsRadiation Dose and Imaging