Fundamentals of Electromigration-Aware Integrated Circuit Design
Jens Lienig, Susann Rothe, Matthias Thiele
Abstract
come, perhaps by some of the readers of this humble book.
Topics & Concepts
ElectromigrationReliability engineeringComputer scienceMaterials scienceElectrical engineeringEngineeringCopper Interconnects and ReliabilityElectronic Packaging and Soldering Technologies