Understanding importance of positive and negative signs of optimized weights used in the sum of weighted normalized Fourier spectrum/envelope spectrum for machine condition monitoring
Bingchang Hou, Dong Wang, Jin-Zhen Kong, Jie Liu, Zhike Peng, Kwok‐Leung Tsui
Topics & Concepts
KurtosisAlgorithmEnvelope (radar)MathematicsFrequency domainVibrationFourier transformFault (geology)Computer scienceStatisticsMathematical analysisAcousticsGeologyPhysicsRadarTelecommunicationsSeismologyMachine Fault Diagnosis TechniquesStructural Health Monitoring TechniquesAdvanced machining processes and optimization