Reliability estimation from two types of accelerated testing data based on an artificial neural network supported Wiener process
Di Liu, Shaoping Wang, Chao Zhang
Topics & Concepts
Artificial neural networkReliability (semiconductor)Wiener processComputer scienceProcess (computing)Test dataPopulationArtificial intelligenceMathematicsStatisticsPower (physics)Operating systemDemographyQuantum mechanicsPhysicsProgramming languageSociologyReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsPower System Reliability and Maintenance