IDD-Net: Industrial defect detection method based on Deep-Learning
Zekai Zhang, Mingle Zhou, Honglin Wan, Min Li, Gang Li, Delong Han, Delong Han
Topics & Concepts
Computer scienceNet (polyhedron)Backbone networkFeature (linguistics)Artificial intelligenceScalabilityScale (ratio)Deep learningSimilarity (geometry)Pattern recognition (psychology)Image (mathematics)Computer networkDatabaseMathematicsLinguisticsQuantum mechanicsPhilosophyPhysicsGeometryIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisNon-Destructive Testing Techniques