Analysis of performance for novel pocket-doped NCFET under the influence of interface trap charges and temperature variation
Malvika Malvika, Bijit Choudhuri, Kavicharan Mummaneni
Topics & Concepts
Materials scienceTrap (plumbing)DopingThreshold voltageOptoelectronicsCurrent (fluid)VoltageElectrical engineeringPhysicsTransistorEngineeringMeteorologySemiconductor materials and devicesFerroelectric and Negative Capacitance DevicesAdvancements in Semiconductor Devices and Circuit Design