Inch-size Cs<sub>3</sub>Bi<sub>2</sub>I<sub>9</sub> polycrystalline wafers with near-intrinsic properties for ultralow-detection-limit X-ray detection
Nuo Bu, Shanshan Jia, Yingrui Xiao, Haojin Li, Nan Li, Xinmei Liu, Zhou Yang, Kui Zhao, Shengzhong Liu
Abstract
A scalable method has been developed to fabricate large size Cs 3 Bi 2 I 9 wafer by hot-pressing ball-milled Cs 3 Bi 2 I 9 powder. The wafer shows near-intrinsic properties and good optoelectronic properties to achieve a detector with low X-ray detection limit.
Topics & Concepts
Materials scienceWaferCrystalliteDetection limitLimit (mathematics)DetectorOptoelectronicsOpticsMetallurgyPhysicsMathematicsMathematical analysisStatisticsAdvanced Semiconductor Detectors and MaterialsRadiation Detection and Scintillator TechnologiesPerovskite Materials and Applications