A Reliable and Temperature Variation Tolerant 7T SRAM Cell with Single Bitline Configuration for Low Voltage Application
Bhawna Rawat, Poornima Mittal
Topics & Concepts
Static random-access memoryProcess variationVoltageMicroprocessorComputer scienceReliability (semiconductor)Node (physics)TransistorProcess cornersElectronic engineeringPower (physics)Computer hardwareElectrical engineeringEngineeringPhysicsStructural engineeringQuantum mechanicsLow-power high-performance VLSI designSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit Design