Machine learning classification algorithm for VLSI test cost reduction
Tai Song, Zhengfeng Huang, Aibin Yan
Topics & Concepts
BottleneckVery-large-scale integrationAlgorithmTest (biology)Reduction (mathematics)Integrated circuitComputer scienceTest compressionk-nearest neighbors algorithmSelection (genetic algorithm)Automatic test pattern generationMachine learningReliability engineeringArtificial intelligenceEngineeringMathematicsElectronic circuitEmbedded systemPaleontologyElectrical engineeringBiologyOperating systemGeometryVLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems