Analysis of interface properties and associated void of nanoscale Al precipitates in Al-Si alloys: First-principles calculations and experiment
Yifan Wang, Yanli Lu, Shiyao Zhang, Yi Wang, Lijia Tong, Hong Wang, Zheng Chen
Topics & Concepts
Materials scienceVacancy defectVoid (composites)Grain boundaryHigh-resolution transmission electron microscopyEutectic systemTransmission electron microscopyDensity functional theoryAtom (system on chip)Chemical physicsSurface energyCrystallographyAlloyNanotechnologyMicrostructureComposite materialComputational chemistryChemistryEmbedded systemComputer scienceAluminum Alloy Microstructure PropertiesAluminum Alloys Composites PropertiesMicrostructure and mechanical properties