Bias Temperature Instability of a-IGZO TFTs Under Repeated Stress and Recovery
Yonghee Jeong, Hyunjin Kim, Jungyeop Oh, Sung‐Yool Choi, Hamin Park
Topics & Concepts
Materials scienceStress (linguistics)Thin-film transistorAmorphous solidInstabilityThreshold voltageCondensed matter physicsOptoelectronicsTransistorVoltageChemistryNanotechnologyElectrical engineeringPhysicsCrystallographyPhilosophyMechanicsLinguisticsLayer (electronics)EngineeringThin-Film Transistor Technologies