Efficient neural network compression via transfer learning for machine vision inspection
Seunghyeon Kim, Yung‐Kyun Noh, Frank C. Park
Topics & Concepts
Computer scienceTransfer of learningArtificial intelligenceScratchBenchmark (surveying)Machine learningDomain (mathematical analysis)Pattern recognition (psychology)Artificial neural networkConvolution (computer science)Image (mathematics)Deep learningConvolutional neural networkComputer visionMathematical analysisOperating systemGeodesyMathematicsGeographyIndustrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesDomain Adaptation and Few-Shot Learning