A reliability analysis method based on the mixed correlated competition model considering multi-performance degradation and sudden failures
Guangze Pan, Guangkuo Guo, Dan Li, Yaqiu Li, Qian Li, Wenwei Liu
Topics & Concepts
Weibull distributionReliability (semiconductor)Nonlinear systemDegradation (telecommunications)Reliability engineeringCopula (linguistics)EngineeringComputer scienceEconometricsStatisticsMathematicsPower (physics)Quantum mechanicsPhysicsTelecommunicationsReliability and Maintenance OptimizationProbabilistic and Robust Engineering DesignStatistical Distribution Estimation and Applications