Reliability modeling for competing failure processes with shifting failure thresholds under severe product working conditions
Xingang Wang, Lin Li, Miaoxin Chang, Kaizhong Han
Topics & Concepts
Reliability (semiconductor)Shock (circulatory)Process (computing)Reliability engineeringProduct (mathematics)Computer scienceMultivariable calculusEngineeringMathematicsControl engineeringInternal medicineQuantum mechanicsPhysicsOperating systemMedicinePower (physics)GeometryReliability and Maintenance OptimizationRisk and Safety AnalysisSoftware Reliability and Analysis Research