Litcius/Paper detail

Data-driven based cross-coupling compensation method for the piezoelectric tube scanner of atomic force microscopes

Yixuan Meng, Linlin Li, Xiangyuan Wang, Xinquan Zhang, Limin Zhu

2023Measurement14 citationsDOI

Topics & Concepts

Feed forwardScannerSIGNAL (programming language)Compensation (psychology)Sampling (signal processing)Coupling (piping)HarmonicControl theory (sociology)Controller (irrigation)PiezoelectricityPhase (matter)AcousticsAtomic force microscopyMaterials sciencePhysicsOpticsEngineeringComputer scienceNanotechnologyArtificial intelligenceControl engineeringControl (management)AgronomyProgramming languageQuantum mechanicsPsychoanalysisPsychologyDetectorBiologyMetallurgyForce Microscopy Techniques and ApplicationsPiezoelectric Actuators and ControlAdvanced Measurement and Metrology Techniques
Data-driven based cross-coupling compensation method for the piezoelectric tube scanner of atomic force microscopes | Litcius