Litcius/Paper detail

Automatic detection of tomato leaf contamination portion using deep neural network

Shwetha Sirikonda, S. Naresh Kumar, G. Chandana, Musku Nikhitha, S. Hima Sree, Kommabatla Mahender

2022AIP conference proceedings31 citationsDOI

Topics & Concepts

ContaminationArtificial neural networkComputer scienceArtificial intelligenceDeep neural networksBiologyEcologySmart Agriculture and AISpectroscopy and Chemometric AnalysesLeaf Properties and Growth Measurement