An Age-Dependent Prognostic Model for Nonlinear Degrading Devices Based on Diffusion Process
Zhengxin Zhang, Tianmei Li, Jianxun Zhang, Dangbo Du, Xiaosheng Si
Abstract
Degradation modeling-based remaining useful life (RUL) predicting has become a significant basis of prognotics and system health management (PHM) and has drawn much favor of both scholars and engineers in the field of reliability. Based on a purely time-dependent diffusion process, this article presents a nonlinear degradation model with a special focus on the proportional relationship between the age-dependent expectation and variance of the degradation processes of the concerned devices. Exact probability density function (pdf) and cumulative distribution function (cdf) of lifetime and RUL in explicit forms are derived under the concept of first hitting time (FHT), incorporating the item-to-item variability. A framework of maximizing the likelihood function has been proposed to estimate the unknown parameters utilizing condition monitoring (CM) data of the devices. Case studies of fatigue crack length data of alloy and capacity data of electrolytic capacitors have been presented to illustrate the proposed prognostics model. The results show that the proposed degradation model can be well fitted to the nonlinear degradation data and provide an accurate prediction of RUL, and thus demonstrate the effectiveness of the proposed model.