The Electron Spectro-Microscopy (ESM) Beamline at NSLS-II
A. Rajapitamahuni, Turgut Yilmaz, Konstantine Kaznatcheev, Asish K. Kundu, E. Vescovo, Abdullah Al‐Mahboob, Jerzy T. Sadowski
Abstract
Photoelectron spectroscopy is a primary tool for the study of the electronic structure of materials and the chemical composition of surfaces [1]. High-resolution angle-resolved photoemission spectr...
Topics & Concepts
BeamlineElectron microscopeOpticsMaterials scienceNuclear physicsPhysicsBeam (structure)Ga2O3 and related materialsAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy Techniques