A novel tunnel-lining crack recognition system based on digital image technology
Mingfeng Lei, Linghui Liu, Chenghua Shi, Yuan Tan, Yuexiang Lin, Weidong Wang
Topics & Concepts
PreprocessorReliability (semiconductor)Noise (video)CalibrationComputer scienceFeature (linguistics)Computer visionEnhanced Data Rates for GSM EvolutionStructural health monitoringImage (mathematics)Artificial intelligenceStructural engineeringEngineeringMathematicsStatisticsLinguisticsPhilosophyPower (physics)Quantum mechanicsPhysicsInfrastructure Maintenance and MonitoringStructural Health Monitoring TechniquesGeotechnical Engineering and Underground Structures