Characterization of iron-based surface multilayer-structured tungsten carbide composite layers by EBSD and FIB/TEM
Xiaolong Cai, Yunhua Xu, Mingxin Liu, Baowei Cao, Xin Li
Topics & Concepts
Materials scienceElectron backscatter diffractionTungsten carbideMicrostructureCarbideTungstenLayer (electronics)Composite materialTransmission electron microscopyFocused ion beamMetallurgyNanotechnologyIonQuantum mechanicsPhysicsAdvanced materials and compositesMetal and Thin Film MechanicsFusion materials and technologies