Direct assessment of structural order and evidence for stacking faults in layered hybrid perovskite films from X-ray scattering measurements
Wen Liang Tan, Yi‐Bing Cheng, Christopher R. McNeill
Abstract
The in-plane (0<italic>k</italic>0) reflections in highly textured Ruddlesden–Popper hybrid perovskite films are probed using synchrotron-based X-ray scattering measurements, providing direct evidence for the presence of structurally ordered <italic>n</italic>-phases.
Topics & Concepts
StackingScatteringPerovskite (structure)SynchrotronMaterials scienceX-rayX-ray crystallographyOrder (exchange)CrystallographyCondensed matter physicsDiffractionOpticsPhysicsChemistryNuclear magnetic resonanceFinanceEconomicsPerovskite Materials and ApplicationsMagnetic and transport properties of perovskites and related materialsAdvanced Condensed Matter Physics