Orientation and strain dependence of dislocations in aluminum layer of Al/Mg/Al laminates: High-resolution EBSD analysis
Peng Peng, Shaosong Jiang, Yong Jia, Cong Han, Pengyu You, Jinyuan Zhang, Yang Li, Zhen Lu
Topics & Concepts
Electron backscatter diffractionMaterials scienceOrientation (vector space)AluminiumLayer (electronics)High resolutionDislocationComposite materialDiffractionCrystallographyStrain (injury)GeometryCondensed matter physicsMetallurgyOpticsMicrostructureChemistryGeologyPhysicsRemote sensingMedicineInternal medicineMathematicsAdvanced Welding Techniques AnalysisAluminum Alloy Microstructure PropertiesNon-Destructive Testing Techniques