Total Ionization Dose (TID) Effects on 2D MOS Devices

Shashi Bala, Raj Kumar, Arvind Kumar

2020Transactions on Electrical and Electronic Materials19 citationsDOI

Topics & Concepts

Materials scienceAbsorbed doseElectronicsOptoelectronicsIonizationIonizing radiationThreshold voltageMOSFETRadiationSilicon on insulatorSiliconVoltageIrradiationIonElectrical engineeringTransistorPhysicsNuclear physicsEngineeringQuantum mechanicsRadiation Effects in ElectronicsSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis