A SIA-LSTM based virtual metrology for quality variables in irregular sampled time sequence of industrial processes
Xiaofeng Yuan, Zhenzhen Jia, Lin Li, Kai Wang, Lingjian Ye, Yalin Wang, Chunhua Yang, Weihua Gui
Topics & Concepts
Computer scienceSampling (signal processing)Interval (graph theory)Process (computing)Sequence (biology)Artificial intelligenceKey (lock)Series (stratigraphy)State (computer science)Sampling intervalTime seriesPattern recognition (psychology)AlgorithmData miningMachine learningComputer visionMathematicsStatisticsOperating systemBiologyCombinatoricsPaleontologyFilter (signal processing)Computer securityGeneticsFault Detection and Control SystemsNeural Networks and ApplicationsAdvanced Data Processing Techniques