Litcius/Paper detail

Ionizing radiation defects and reliability of Gallium Nitride-based III-V semiconductor devices: A comprehensive review

V. Sandeep, J. Charles Pravin, S. Ashok Kumar

2024Microelectronics Reliability17 citationsDOI

Topics & Concepts

Ionizing radiationGallium nitrideReliability (semiconductor)OptoelectronicsMaterials scienceSemiconductorReliability engineeringGalliumEngineering physicsNanotechnologyEngineeringIrradiationPhysicsMetallurgyNuclear physicsPower (physics)Layer (electronics)Quantum mechanicsGaN-based semiconductor devices and materialsSemiconductor materials and devicesSemiconductor Quantum Structures and Devices