Atom Probe Tomography for the Observation of Hydrogen in Materials: A Review
Yi‐Sheng Chen, Pang-Yu Liu, Ranming Niu, Arun Devaraj, Hung‐Wei Yen, R.K.W. Marceau, Julie M. Cairney
Abstract
Abstract Atom probe tomography (APT) is an emerging microscopy technique that has high sensitivity for hydrogen with sub-nanometre-scale spatial resolution, which makes it a unique method to investigate the atomic-scale distribution of hydrogen at interfaces and defects in materials. This article introduces the basics of APT-based hydrogen analysis, particularly the challenge of distinguishing a hydrogen background signal in APT by using hydrogen isotopes, along with strategies to yield high-quality analysis. This article also reviews several important findings on hydrogen distribution in a range of materials, including both structural alloys and functional materials, enabled by using APT. Limitations and future opportunities for hydrogen analysis by APT are also discussed.