A remaining useful life prediction method of IGBT based on online status data
Jinli Zhang, Jinbao Hu, Hailong You, Renxu Jia, Xiaowen Wang, Xiaowen Zhang
Topics & Concepts
Insulated-gate bipolar transistorFuse (electrical)Noise (video)Computer scienceFilter (signal processing)Power (physics)Support vector machineFeature (linguistics)EngineeringReliability engineeringArtificial intelligenceElectrical engineeringImage (mathematics)PhilosophyLinguisticsPhysicsQuantum mechanicsComputer visionSilicon Carbide Semiconductor TechnologiesAdvancements in Semiconductor Devices and Circuit DesignElectrostatic Discharge in Electronics