Litcius/Paper detail

Particle Induced X-ray Emission spectrometry (PIXE) of Hawaiian volcanics: An analogue study to evaluate the APXS field analysis of geologic materials on Mars

J. A. Berger, M. E. Schmidt, John L. Campbell, Erin L. Flannigan, R. Gellert, D. W. Ming, R. V. Morris

2020Icarus14 citationsDOI

Topics & Concepts

BasaltMars Exploration ProgramMineralogySilicateVolcanoMass spectrometryAnalytical Chemistry (journal)GeologyMaterials scienceGeochemistryChemistryAstrobiologyEnvironmental chemistryPhysicsOrganic chemistryChromatographyGeological and Geochemical AnalysisX-ray Spectroscopy and Fluorescence AnalysisGeochemistry and Geologic Mapping
Particle Induced X-ray Emission spectrometry (PIXE) of Hawaiian volcanics: An analogue study to evaluate the APXS field analysis of geologic materials on Mars | Litcius