Reliability evaluation of DQcube based on g-good neighbor and g-component fault pattern
Hong Zhang, Shuming Zhou, Jiafei Liu, Qianru Zhou, Zhengqin Yu
Topics & Concepts
HypercubeComponent (thermodynamics)Reliability (semiconductor)MathematicsGraphMultiprocessingConnected componentCombinatoricsComputer scienceParallel computingPhysicsThermodynamicsQuantum mechanicsPower (physics)Interconnection Networks and SystemsReliability and Maintenance OptimizationVLSI and Analog Circuit Testing