XPS insights: Sample degradation in X‐ray photoelectron spectroscopy
David Morgan
Abstract
Standard X‐ray photoelectron spectroscopy (XPS) analysis is thought of by many as a non‐destructive form of analysis; however, both the interaction of the X‐ray photons and the subsequent electron cascade can cause significant changes to the analysed area. This XPS Insights paper gives a brief overview to this phenomenon, supported by specific examples and experimental advice to assess and minimise damage during analysis.
Topics & Concepts
X-ray photoelectron spectroscopyAnalytical Chemistry (journal)X-rayMaterials scienceChemistryPhysicsNuclear magnetic resonanceEnvironmental chemistryOpticsElectron and X-Ray Spectroscopy TechniquesX-ray Spectroscopy and Fluorescence AnalysisMachine Learning in Materials Science