A gamma process based model for systems subject to multiple dependent competing failure processes under Markovian environments
Bei Wu, Dong Ding
Topics & Concepts
CorrectnessReliability (semiconductor)Gamma processMarkov processComputer scienceReliability engineeringProcess (computing)Laplace transformFunction (biology)EngineeringAlgorithmMathematicsEvolutionary biologyQuantum mechanicsMathematical analysisStatisticsPhysicsOperating systemPower (physics)BiologyReliability and Maintenance OptimizationSoftware Reliability and Analysis ResearchRisk and Safety Analysis