Black-Box Test-Cost Reduction Based on Bayesian Network Models
Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu
Abstract
The growing complexity of circuit boards makes manufacturing test increasingly expensive. In order to reduce test cost, a number of test selection methods have been proposed in the literature. However, only few of these methods can be applied to black-box test-cost reduction. In this article, we propose a novel black-box test selection method based on Bayesian networks (BNs), which extract the strong relationship among tests. First, the problem of reducing the black-box test cost is formulated as a constrained optimization problem. Next, multiple structure learning and transfer learning algorithms are implemented to construct BN models. Based on these BN models, we propose an iterative test selection method with a new metric, Bayesian index, for test-cost reduction. In addition, averaging strategies are applied to enhance the reduction performance. Finally, a robust model selection framework is proposed to select the optimal BN model for test-cost reduction. Two case studies with production test data demonstrate that when no prior information is provided, our proposed approach effectively reduces the test cost by up to 14.7%, compared to the state-of-the-art greedy algorithm. Moreover, our proposed approach further reduces the test cost by up to 7.1% when prior information is provided from similar products.