Litcius/Paper detail

Angular dependence of secondary electron yield from microporous gold surfaces

Jonathan Ludwick, Asif Iqbal, Daniel Gortat, John D. Cook, M. Cahay, Peng Zhang, Tyson C. Back, Steven B. Fairchild, Martin Sparkes, W O’Neill

2020Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena25 citationsDOI

Abstract

We report exhaustive measurements of the secondary electron yield (SEY) from a gold film containing an array of micropores as a function of the angle of incidence of the primary electrons. The SEY measurements are in good agreement with Monte-Carlo (MC) simulations. A highly accurate empirical fit to the SEY data as a function of the incident electron impact angle is also proposed. In this study, the micropores have aspect ratios (ratio of pore height over pore diameter) ranging from about 1.5 to 3.5. The effect of the pore array density (porosity) and pore aspect ratio is analyzed in greater detail. It is found that increasing the pore aspect ratio and porosity leads to a sharp reduction in the total SEY in agreement with MC simulations.

Topics & Concepts

Materials scienceYield (engineering)PorosityMicroporous materialSecondary electronsElectronAspect ratio (aeronautics)Monte Carlo methodAngle of incidence (optics)Analytical Chemistry (journal)Molecular physicsAtomic physicsOpticsComposite materialNuclear physicsPhysicsChemistryMathematicsStatisticsChromatographyElectron and X-Ray Spectroscopy TechniquesSurface and Thin Film PhenomenaMagnetic properties of thin films