Theoretical Justification of Single-Ended Dislocation-Source-Controlled Deformation of Micropillar fcc Crystals
Shin Takeuchi, Keiichi Edagawa, Yasushi Kamimura
Abstract
It was established at the beginning of the 21st century that the critical resolved shear stress of small-sized (diameter from 50 nm to 10 μm) metallic crystals fabricated from bulk crystals increases drastically with decreasing specimen diameter. Dou and Derby [Scr. Mater. 61, 524 (2009)SCMAF71359-646210.1016/j.scriptamat.2009.05.012] showed that, the critical shear stresses of small-sized single crystals of various fcc metals obeyed a universal power law of specimen size with an exponent of -0.66. In this study, we succeeded in reproducing almost perfectly the above universal relation without any adjustable parameters, based on a deformation process controlled by the operation of single-ended dislocation sources.